Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Electrical characterization and reliability study of integrated GaN power ..."

Rui Liu et al. (2011)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2011.06.034

access: closed

type: Journal Article

metadata version: 2024-04-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LiuSRVDMW11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LiuSRVDMW11
Rui Liu, Dominique M. M.-P. Schreurs, Walter De Raedt, Frederik Vanaverbeke, J. Das, Robert Mertens, Ingrid De Wolf:
Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology. Microelectron. Reliab. 51(9-11): 1721-1724 (2011)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.