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"Comparison of TID response in core, input/output and high voltage ..."

Zhangli Liu et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.02.020

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/LiuHZSCBNZ11
Zhangli Liu, Zhiyuan Hu, Zhengxuan Zhang, Hua Shao, Ming Chen, Dawei Bi, Bingxu Ning, Shichang Zou:
Comparison of TID response in core, input/output and high voltage transistors for flash memory. Microelectron. Reliab. 51(6): 1148-1151 (2011)

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