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"Using SOM neural network for X-ray inspection of missing-bump defects in ..."

Guanglan Liao et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.09.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Guanglan Liao, Pengfei Chen, Li Du, Lei Su, Zhiping Liu, Zirong Tang, Tielin Shi:
Using SOM neural network for X-ray inspection of missing-bump defects in three-dimensional integration. Microelectron. Reliab. 55(12): 2826-2832 (2015)

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