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"Investigation of diode geometry and metal line pattern for robust ESD ..."

You Li, Juin J. Liou, Jim Vinson (2008)

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DOI: 10.1016/J.MICROREL.2008.04.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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You Li, Juin J. Liou, Jim Vinson:
Investigation of diode geometry and metal line pattern for robust ESD protection applications. Microelectron. Reliab. 48(10): 1660-1663 (2008)

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