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"Constant voltage stress characterization of nFinFET transistor during ..."

Binhong Li et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.136

access: closed

type: Journal Article

metadata version: 2023-12-26

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  - https://dblp.org/rec/journals/mr/LiHWHLZYWLHY18
Binhong Li, Yang Huang, Jianfei Wu, Yunbo Huang, Bo Li, Qingzhu Zhang, Ling Yang, Fayu Wan, Jiajun Luo, Zhengsheng Han, Huaxiang Yin:
Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment. Microelectron. Reliab. 88-90: 969-973 (2018)

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