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"Investigation of geometry dependence on MOSFET linearity in the impact ..."

Chie-In Lee, Wei-Cheng Lin, Yan-Ting Lin (2015)

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DOI: 10.1016/J.MICROREL.2015.05.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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Chie-In Lee, Wei-Cheng Lin, Yan-Ting Lin:
Investigation of geometry dependence on MOSFET linearity in the impact ionization region using Volterra series. Microelectron. Reliab. 55(8): 1163-1168 (2015)

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