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"[131] Experimental study of the short-circuit robustness of 600 V E-mode ..."

Matthieu Landel et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.042

access: closed

type: Journal Article

metadata version: 2022-10-02

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Matthieu Landel, Cyrille Gautier, Denis Labrousse, Stéphane Lefebvre:
[131] Experimental study of the short-circuit robustness of 600 V E-mode GaN transistors. Microelectron. Reliab. 64: 560-565 (2016)

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