default search action
"High Electric Field Induced Degradation of the DC Characteristics in ..."
J. Kuchenbecker et al. (2003)
- J. Kuchenbecker, Mattia Borgarino, M. Zeuner, U. König, Robert Plana, Fausto Fantini:
High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's. Microelectron. Reliab. 43(9-11): 1719-1723 (2003)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.