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"Negative bias temperature instability (NBTI) recovery with bake."

Anastasios A. Katsetos (2008)

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DOI: 10.1016/J.MICROREL.2008.04.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Anastasios A. Katsetos:
Negative bias temperature instability (NBTI) recovery with bake. Microelectron. Reliab. 48(10): 1655-1659 (2008)

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