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"On the short-circuit and avalanche ruggedness reliability assessment of ..."

Claudiu Ionita, Muhammad Nawaz, Kalle Ilves (2017)

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DOI: 10.1016/J.MICROREL.2017.02.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Claudiu Ionita, Muhammad Nawaz, Kalle Ilves:
On the short-circuit and avalanche ruggedness reliability assessment of SiC MOSFET modules. Microelectron. Reliab. 71: 6-16 (2017)

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