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"Micromechanical analysis of copper trace in printed circuit boards."

Guojun Hu, Yong Goh Kim, Lim Judy (2011)

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DOI: 10.1016/J.MICROREL.2010.08.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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Guojun Hu, Yong Goh Kim, Lim Judy:
Micromechanical analysis of copper trace in printed circuit boards. Microelectron. Reliab. 51(2): 416-424 (2011)

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