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"A wafer-level approach to device lifetesting."

Dorothy June M. Hamada, William J. Roesch (2008)

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DOI: 10.1016/J.MICROREL.2008.04.020

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/HamadaR08
Dorothy June M. Hamada, William J. Roesch:
A wafer-level approach to device lifetesting. Microelectron. Reliab. 48(7): 985-989 (2008)

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