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"Latent gate oxide defects case studies."

Julien Goxe, C. Abouda, Béatrice Vanhuffel (2015)

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DOI: 10.1016/J.MICROREL.2015.06.096

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/GoxeAV15
Julien Goxe, C. Abouda, Béatrice Vanhuffel:
Latent gate oxide defects case studies. Microelectron. Reliab. 55(9-10): 1607-1610 (2015)

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