"System ESD robustness by co-design of on-chip and on-board protection ..."

Harald Gossner, Werner Simbürger, Matthias Stecher (2010)

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DOI: 10.1016/J.MICROREL.2010.07.146

access: closed

type: Journal Article

metadata version: 2021-10-14

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Harald Gossner, Werner Simbürger, Matthias Stecher:
System ESD robustness by co-design of on-chip and on-board protection measures. Microelectron. Reliab. 50(9-11): 1359-1366 (2010)

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