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"Effects of HPEM stress on GaAs low-noise amplifier from circuit to ..."

M. Girard et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.108

access: closed

type: Journal Article

metadata version: 2023-08-10

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M. Girard, Tristan Dubois, Patrick Hoffmann, Geneviève Duchamp:
Effects of HPEM stress on GaAs low-noise amplifier from circuit to component scale. Microelectron. Reliab. 88-90: 914-919 (2018)

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