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"Study of process induced variability of germanium-pTFET in analog and RF ..."

Sayani Ghosh, Kalyan Koley, Chandan Kumar Sarkar (2016)

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DOI: 10.1016/J.MICROREL.2016.07.149

access: closed

type: Journal Article

metadata version: 2020-02-22

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Sayani Ghosh, Kalyan Koley, Chandan Kumar Sarkar:
Study of process induced variability of germanium-pTFET in analog and RF domain. Microelectron. Reliab. 65: 47-54 (2016)

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