"Evaluation of SiGe: C HBT intrinsic reliability using conventional and ..."

Craig A. Gaw et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.02.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Craig A. Gaw, Thomas Arnold, Robert Martin, Lisa Zhang, Dragan Zupac:
Evaluation of SiGe: C HBT intrinsic reliability using conventional and step stress methodologies. Microelectron. Reliab. 46(8): 1272-1278 (2006)

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