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"Intrinsic reliability of a 12 V field plate pHEMT."

Craig A. Gaw, Thomas Arnold, Karen Moore (2008)

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DOI: 10.1016/J.MICROREL.2008.03.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Craig A. Gaw, Thomas Arnold, Karen Moore:
Intrinsic reliability of a 12 V field plate pHEMT. Microelectron. Reliab. 48(7): 974-984 (2008)

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