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"PLL soft functional failure analysis in advanced logic product using fault ..."

Liming Gao, Christian Burmer (2008)

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DOI: 10.1016/J.MICROREL.2008.06.012

access: closed

type: Journal Article

metadata version: 2020-02-22

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Liming Gao, Christian Burmer:
PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization. Microelectron. Reliab. 48(8-9): 1349-1353 (2008)

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