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"Degradation mechanism analysis in temperature stress tests on III-V ..."
P. Espinet et al. (2010)
- P. Espinet, Carlos Algora
, José Ramón González, Neftalí Núñez
, Manuel Vázquez
:
Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model. Microelectron. Reliab. 50(9-11): 1875-1879 (2010)
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