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"Advanced electrical and stability characterization of untrimmed and ..."
Andrzej Dziedzic et al. (2006)
- Andrzej Dziedzic
, Andrzej Kolek
, Waleed Ehrhardt, Heiko Thust:
Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and LTCC resistors. Microelectron. Reliab. 46(2-4): 352-359 (2006)
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