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"Stress analysis and bending tests for GaAs wafers."
W. Dreyer et al. (2006)
- W. Dreyer, F. Duderstadt, S. Eichler, M. Jurisch:
Stress analysis and bending tests for GaAs wafers. Microelectron. Reliab. 46(5-6): 822-835 (2006)
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