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"Potentiality of trap charge effects and SiON induced interface defects in ..."

Syed Mukulika Dinara et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.02.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/DinaraGHBBB15
Syed Mukulika Dinara, Saptarsi Ghosh, Nripendra N. Halder, Ankush Bag, Sekhar Bhattacharya, Dhrubes Biswas:
Potentiality of trap charge effects and SiON induced interface defects in a-Si₃N₄/SiON based MIS structure for resistive NVM device. Microelectron. Reliab. 55(5): 789-794 (2015)

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