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"Selective activation of failure mechanisms in packaged ..."

Yannick Deshayes et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.044

access: closed

type: Journal Article

metadata version: 2023-04-13

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Yannick Deshayes, Isabelle Bord-Majek, G. Barreau, M. Aiche, Philippe Moretto, Laurent Béchou, A. C. Roehrig, Yves Ousten:
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation. Microelectron. Reliab. 48(8-9): 1354-1360 (2008)

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