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"Degradation of 0.25 μm GaN HEMTs under high temperature stress test."

Maximilian Dammann et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.042

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - journals/mr/DammannBBBMKWQM15
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  - https://dblp.org/rec/journals/mr/DammannBBBMKWQM15
Maximilian Dammann, Martina Baeumler, Peter Brückner, Wolfgang Bronner, Stephan Maroldt, Helmer Konstanzer, Matthias Wespel, Rüdiger Quay, Michael Mikulla, Andreas Graff, M. Lorenzini, M. Fagerlind, P. J. van der Wel, T. Rödle:
Degradation of 0.25 μm GaN HEMTs under high temperature stress test. Microelectron. Reliab. 55(9-10): 1667-1671 (2015)

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