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"A unification of interface-state generation and hole-injection for ..."

M. Z. Dai et al. (2008)

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DOI: 10.1016/J.MICROREL.2007.09.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Z. Dai, S. I. Kim, Andrew Yap, Shaohua Liu, Arthur Cheng, Leeward Yi:
A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET. Microelectron. Reliab. 48(4): 504-507 (2008)

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