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"Analysis of punch-through breakdown in bulk silicon RF power LDMOS ..."

Ignasi Cortés et al. (2008)

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DOI: 10.1016/J.MICROREL.2007.06.004

access: closed

type: Journal Article

metadata version: 2021-10-14

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Ignasi Cortés, Pablo Fernández-Martínez, David Flores, Salvador Hidalgo, José Rebollo:
Analysis of punch-through breakdown in bulk silicon RF power LDMOS transistors. Microelectron. Reliab. 48(2): 173-180 (2008)

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