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"Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs."

Hsien-Chin Chiu et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.09.002

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/ChiuCCKC17
Hsien-Chin Chiu, Min-Li Chou, Chun-Hu Cheng, Hsuan-Ling Kao, Cheng-Lin Cho:
Effect of body bias and temperature on low-frequency noise in 40-nm nMOSFETs. Microelectron. Reliab. 78: 267-271 (2017)

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