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"Post-breakdown leakage resistance and its dependence on device area."
Tze Wee Chen et al. (2006)
- Tze Wee Chen, Choshu Ito, William Loh, Robert W. Dutton:
Post-breakdown leakage resistance and its dependence on device area. Microelectron. Reliab. 46(9-11): 1612-1616 (2006)
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