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"Embed SRAM IDDOFF fail root cause identification by combination of device ..."

Changqing Chen et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.07.015

access: closed

type: Journal Article

metadata version: 2021-12-21

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Changqing Chen, Ghim Boon Ang, Peng Tiong Ng, Francis Rivai, Hui Peng Ng, Alfred C. T. Quah, Angela Teo, Jeffery Lam, Zhihong Mai:
Embed SRAM IDDOFF fail root cause identification by combination of device analysis and localized circuit analysis. Microelectron. Reliab. 76-77: 261-266 (2017)

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