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"Reliability predictions in electronic industrial applications."
G. Cassanelli et al. (2005)
- G. Cassanelli, Giovanna Mura
, F. Cesaretti, Massimo Vanzi, Fausto Fantini
:
Reliability predictions in electronic industrial applications. Microelectron. Reliab. 45(9-11): 1321-1326 (2005)
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