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"Experimental study of power MOSFET's gate damage in radiation environment."
Giovanni Busatto et al. (2006)
- Giovanni Busatto
, Francesco Iannuzzo
, Alberto Porzio, Annunziata Sanseverino, Francesco Velardi, Giuseppe Currò:
Experimental study of power MOSFET's gate damage in radiation environment. Microelectron. Reliab. 46(9-11): 1854-1857 (2006)
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