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"A new test methodology for an exhaustive study of single-event-effects on ..."

Giovanni Busatto et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.023

access: closed

type: Journal Article

metadata version: 2020-02-22

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Giovanni Busatto, D. Bisello, Giuseppe Currò, Piero Giubilato, Francesco Iannuzzo, S. Mattiazzo, D. Pantano, Annunziata Sanseverino, L. Silvestrin, M. Tessaro, Francesco Velardi, Jeffery Wyss:
A new test methodology for an exhaustive study of single-event-effects on power MOSFETs. Microelectron. Reliab. 51(9-11): 1995-1998 (2011)

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