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"IGBT modules robustness during turn-off commutation."

Giovanni Busatto et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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Giovanni Busatto, Carmine Abbate, B. Abbate, Francesco Iannuzzo:
IGBT modules robustness during turn-off commutation. Microelectron. Reliab. 48(8-9): 1435-1439 (2008)

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