"Ageing of SiC JFET transistors under repetitive current limitation conditions."

M. Bouarroudj-Berkani et al. (2010)

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DOI: 10.1016/J.MICROREL.2010.07.035

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Bouarroudj-Berkani, D. Othman, Stéphane Lefebvre, S. Moumen, Zoubir Khatir, T. Ben Sallah:
Ageing of SiC JFET transistors under repetitive current limitation conditions. Microelectron. Reliab. 50(9-11): 1532-1537 (2010)

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