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"Testing semiconductor devices at extremely high operating temperatures."

Peter Borthen, Gerhard K. M. Wachutka (2008)

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DOI: 10.1016/J.MICROREL.2008.07.037

access: closed

type: Journal Article

metadata version: 2020-02-22

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Peter Borthen, Gerhard K. M. Wachutka:
Testing semiconductor devices at extremely high operating temperatures. Microelectron. Reliab. 48(8-9): 1440-1443 (2008)

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