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"Impact of silicon nitride CESL on NLDEMOS transistor reliability."

Gaelle Beylier et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.035

access: closed

type: Journal Article

metadata version: 2020-10-29

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  - https://dblp.org/rec/journals/mr/BeylierBBG08
Gaelle Beylier, Sylvie Bruyère, Darcy Benoit, Gérard Ghibaudo:
Impact of silicon nitride CESL on NLDEMOS transistor reliability. Microelectron. Reliab. 48(8-9): 1539-1543 (2008)

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