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"Identifying electrical mechanisms responsible for functional failures ..."
P. Besse, K. Abouda, C. Abouda (2011)
- P. Besse, K. Abouda, C. Abouda:
Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression. Microelectron. Reliab. 51(9-11): 1597-1601 (2011)
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