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"Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition."

Walter E. Calienes Bartra et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.063

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/BartraAMVR17
Walter E. Calienes Bartra, Y. Q. de Aguiar, Cristina Meinhardt, Andrei Vladimirescu, Ricardo Augusto da Luz Reis:
Evaluation of heavy-ion impact in bulk and FDSOI devices under ZTC condition. Microelectron. Reliab. 76-77: 655-659 (2017)

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