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"Test generation at the algorithm-level for gate-level fault coverage."

Eduardas Bareisa et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.03.017

access: closed

type: Journal Article

metadata version: 2023-03-21

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Eduardas Bareisa, Vacius Jusas, Kestutis Motiejunas, Rimantas Seinauskas:
Test generation at the algorithm-level for gate-level fault coverage. Microelectron. Reliab. 48(7): 1093-1101 (2008)

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