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"Reliability- and process-variation aware design of integrated circuits."

Muhammad Ashraful Alam (2008)

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DOI: 10.1016/J.MICROREL.2008.07.039

access: closed

type: Journal Article

metadata version: 2020-02-22

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Muhammad Ashraful Alam:
Reliability- and process-variation aware design of integrated circuits. Microelectron. Reliab. 48(8-9): 1114-1122 (2008)

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