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"Analysis of the charge sharing effect in the SET sensitivity of bulk ..."
Ygor Q. Aguiar et al. (2018)
- Ygor Q. Aguiar
, Frederic Wrobel
, Jean-Luc Autran, Paul Leroux
, Frédéric Saigné, Antoine D. Touboul, Vincent Pouget:
Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions. Microelectron. Reliab. 88-90: 920-924 (2018)
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