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"Investigation on the effect of external mechanical stress on the DC ..."

K. Adokanou et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.033

access: closed

type: Journal Article

metadata version: 2021-06-14

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K. Adokanou, Karim Inal, Pierre Montmitonnet, F. Pressecq, Barbara Bonnet, J. L. Muraro:
Investigation on the effect of external mechanical stress on the DC characteristics of GaAs microwave devices. Microelectron. Reliab. 55(9-10): 1697-1702 (2015)

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