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"Measure of high frequency input impedance to study the instability of ..."

Carmine Abbate et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.035

access: closed

type: Journal Article

metadata version: 2020-02-22

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Carmine Abbate, Giovanni Busatto, Annunziata Sanseverino, D. Tedesco, Francesco Velardi:
Measure of high frequency input impedance to study the instability of power devices in short circuit. Microelectron. Reliab. 88-90: 540-544 (2018)

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