"A double-modules interlocking triple-node upset-tolerant latch design."

Shiyu Zhao et al. (2025)

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DOI: 10.1016/J.MEJO.2025.106647

access: closed

type: Journal Article

metadata version: 2025-05-09

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Shiyu Zhao, Qiang Zhao, Licai Hao, Hao Wang, Lang Tian, Chunyu Peng, Wenjuan Lu, Zhiting Lin, Xiulong Wu:
A double-modules interlocking triple-node upset-tolerant latch design. Microelectron. J. 159: 106647 (2025)

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