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"Test response reuse-based SoC core test compression and test scheduling ..."

Jingbo Shao et al. (2008)

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DOI: 10.1016/J.MEJO.2008.03.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jingbo Shao, Guangsheng Ma, Zhi Yang, Ruixue Zhang:
Test response reuse-based SoC core test compression and test scheduling for test application time minimization. Microelectron. J. 39(12): 1704-1709 (2008)

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