"A current based self-test methodology for RF front-end circuits."

Anand Gopalan, Martin Margala, P. R. Mukund (2005)

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DOI: 10.1016/J.MEJO.2005.04.064

access: closed

type: Journal Article

metadata version: 2020-02-22

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Anand Gopalan, Martin Margala, P. R. Mukund:
A current based self-test methodology for RF front-end circuits. Microelectron. J. 36(12): 1091-1102 (2005)

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