"Analysis and optimization of leakage current characteristics in sub-65 nm ..."

Na Gong et al. (2008)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2008.01.028

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/GongGLW08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/GongGLW08
Na Gong, Baozeng Guo, Jianzhong Lou, Jinhui Wang:
Analysis and optimization of leakage current characteristics in sub-65 nm dual V_t footed domino circuits. Microelectron. J. 39(9): 1149-1155 (2008)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.