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"Analysis and optimization of leakage current characteristics in sub-65 nm ..."

Na Gong et al. (2008)

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DOI: 10.1016/J.MEJO.2008.01.028

access: closed

type: Journal Article

metadata version: 2020-02-22

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Na Gong, Baozeng Guo, Jianzhong Lou, Jinhui Wang:
Analysis and optimization of leakage current characteristics in sub-65 nm dual V_t footed domino circuits. Microelectron. J. 39(9): 1149-1155 (2008)

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