"Vacuum UV spectroscopic ellipsometry study on ..."

T. H. Ghong et al. (2008)

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DOI: 10.1016/J.MEJO.2007.07.030

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/GhongKLKKMY08
T. H. Ghong, T. J. Kim, S. Y. Lee, Y. D. Kim, J. J. Kim, Hisao Makino, T. Yao:
Vacuum UV spectroscopic ellipsometry study on Ga_1-xCr_xN(0<=x<=0.1) alloy films. Microelectron. J. 39(3-4): 541-543 (2008)

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