"Simulation of system backend dielectric reliability."

Chang-Chih Chen et al. (2014)

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DOI: 10.1016/J.MEJO.2014.01.008

access: closed

type: Journal Article

metadata version: 2022-04-15

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Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim:
Simulation of system backend dielectric reliability. Microelectron. J. 45(10): 1327-1334 (2014)

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